Thin Film data
A compact deposition system for ultra thin crystalline film growth,
R. E. Lake*, J. R. Puls, M. P. Ray and C. E. Sosolik 
Low temperature metal deposition processes for optoelectronic devices
Larry N. Lewis, Kevin H. Janora, Jie Liu, Shellie Gasaway, & Eric P. Jacobson
GE Global Research
Kelvin Probe data
Kelvin Probe Measurements in Assembling Ionic Interfaces via Soft-Landed Ions,
A. A. Tsekouras, M. J. Iedema, J. P. Cowin, Pacific Northwest National Laboratory, G.B. Ellison, Department of Chemistry & Biochemistry, University of Colorado
Real-Time Work Function Change Measurements During Surface Reactions,
Michael X. Yang, Andrew V. Teplyakov, Phillip W. Kash and Brian E. Bent, Columbia University
On the Elimination of Spacing Dependent Errors in the Kelvin Probe,
Van L. Eden and Robert C. McAllister, McAllister Technical Services
A simple procedure for adjusting the balance in the KP preamplifier.
Scanning Tunneling Microscope data
A Scanning Tunneling Microscopy and Spectroscopy Study of Vanadyl Phthalocyanine on Au(111)
D. Barlow and KW Hipps, Washing State University
Chemical Selectivity in Scanning Tunneling Microscopy
Professor Kerry W. Hipps, Washington State University